Locating stuck faults in analog circuits
نویسندگان
چکیده
A new approach is proposed in this paper to detect the stuck faults in linear analog circuits. Ideal switches are inserted to indicate stuck-at, bridging and stuck-open locations. Then the resulting circuit is analyzed and stuck faults are directly identified. A recently developed method for multiple analog fault diagnosis is used eliminating a need for fault dictionary approach. The effect of locating stuck-at, bridging and stuckopen faults is modeled with full precision of resulting test conditions. An analog IC μA741 is given as an example.
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